Friday, March 18, 2011

Multitest’s Mercury Contactors for Wafer-Level Test Deployed to Subcontractors in Asia

PRLog (Press Release)– Mar 17, 2011– Rosenheim, Germany -- Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrat drum garbage compact wood lathes machine or ed device manufacturers (IDMs) and final test subcontractors worldwide, announces that another major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors. These Mercury contactors have eight sites and more than spring probes per site.     The contactors passed all qualification tests in the United States and now have been deployed to multiple testing subcontractors in Taiwan and Singapore. Based on this successful evaluation, the manufacturer has awarded Multitest with two additional WLCSP projects. Several of the Asian subcontractors have experience with the Mercury technology and are pleased with the long life, low maintenance requirements and low replacement probe price that the Mercury contactors provide.

The Mercury success story includes thousands of contactors for singulated devices, strip test and wafer-level test. The popularity of Mercury is due to the superior mechanical and electrical garbage compactor review performance that results from its unique architecture and manufacturing process. To quantify the performance, the probes have a bandwidth of approximately 20 GHz, a current-carrying capacity of more than 2 A, an inductance of approximately 1 nH and a life of waste compactor over one million insertions at wafer-level (values are pitch-dependent).

For more information about Multitest's Mercury-based wafer-level contactors, visit http://www.multitest.com.


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